Posted in | MRS 2011 Fall Meeting | Nanomaterials

The AFM+ from Anasys Instruments

Roshan Shetty from Anasys Instruments shows us their new AFM+ platform. This new development has been designed as a modular entry level instrument that combines an atomic force microscope and thermal analysis capabilities. It has been designed so that it can be upgraded to their NanoIR spec at a later date.

In its' standard form it can be used to create 3-dimensional surface maps and perform thermal analysis on spots in the sample surface, which can be useul for determining such things as glass transition points and melting temperatures. This in turn can be used for analysis of blended materials and assessment of homogeneity.

Both the thermal analysis and FTIR capabilities use patented technology usnique to Anasys Instruments.

Run time - 4:51min

The AFM+ from Anasys Instruments

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