EDAX

EDAX

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5794 W. Las Positas Blvd.
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CA, 94588
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EDAX is the global leader in Energy Dispersive X-ray Microanalysis, Electron Backscatter Diffraction, X-ray Metrology analyzers and Micro X-ray Fluorescence systems. EDAX manufactures, markets and services high-quality products and systems for leading companies in semiconductors, metals, and geological, biological, material and ceramics markets.

Since its founding in 1962, EDAX has utilized its knowledge and expertise to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electric motors with annualized sales of more than $1.8 billion.

Using OIM Analysis for Correlative Microscopy

Using OIM Analysis for Correlative Microscopy
Microscale Analysis of Lithium-Containing Compounds and Alloys

Microscale Analysis of Lithium-Containing Compounds and Alloys
Using Li-Ion Battery Cathode Materials to Improve EBSD Characterization

Using Li-Ion Battery Cathode Materials to Improve EBSD Characterization
What is Spherical Indexing?

What is Spherical Indexing?
Low-Dose Electron Backscatter Diffraction Analysis

Low-Dose Electron Backscatter Diffraction Analysis
The Role of Solidification in the Development of Microstructures

The Role of Solidification in the Development of Microstructures
Using EBSD to Characterize Additively Manufacture Stainless Steel

Using EBSD to Characterize Additively Manufacture Stainless Steel
Materials and Parent Phase Reconstruction

Materials and Parent Phase Reconstruction
Quantitative Mapping of Lithium in the SEM

Quantitative Mapping of Lithium in the SEM
Understanding the Microstructure in Multi-Phase Samples with Chemical Indexing Scan

Understanding the Microstructure in Multi-Phase Samples with Chemical Indexing Scan
SEM and EDS Mapping of Geological Materials

SEM and EDS Mapping of Geological Materials
How to Use Dual EDS Detectors for X-Ray Mapping

How to Use Dual EDS Detectors for X-Ray Mapping
The Study of Microstructures in Stainless Steel Oxide Scales

The Study of Microstructures in Stainless Steel Oxide Scales
Characterizing Samples with Integrated EDS-EBSD

Characterizing Samples with Integrated EDS-EBSD
Polycrystalline Materials and EBSD Analysis

Polycrystalline Materials and EBSD Analysis
Using EBSD to Characterize the Deformation Microstructure of an Additively Manufactured 316-L Stainless Steel Alloy

Using EBSD to Characterize the Deformation Microstructure of an Additively Manufactured 316-L Stainless Steel Alloy
Combining EDS-EBSD Analysis to Characterize the Microstructure of a Nitrided Steel

Combining EDS-EBSD Analysis to Characterize the Microstructure of a Nitrided Steel
Characterizing Intermetallic Phases in Duplex Steel Alloys Using Pegasus

Characterizing Intermetallic Phases in Duplex Steel Alloys Using Pegasus
Optimizing Steel Properties by Controlling Retained Austenite Content Using EBSD

Optimizing Steel Properties by Controlling Retained Austenite Content Using EBSD
Using EBSD and EDS to Analyze the Microstructures of Optical Materials

Using EBSD and EDS to Analyze the Microstructures of Optical Materials
Improving the Material Properties of Additive Manufactured Metals Using EBSD

Improving the Material Properties of Additive Manufactured Metals Using EBSD
Improving Fuel Efficiency in Automotive Applications Using Lightweight Structural Materials

Improving Fuel Efficiency in Automotive Applications Using Lightweight Structural Materials
EBSD Data Collection and Analysis

EBSD Data Collection and Analysis
An Introduction into the Broad Argon Ion Beam Tool

An Introduction into the Broad Argon Ion Beam Tool
Discussing Electron Backscatter Diffraction (EBSD) with EDAX

Discussing Electron Backscatter Diffraction (EBSD) with EDAX
Applications of High-Speed CMOS Cameras for EBSD Micro-Structural Analysis

Applications of High-Speed CMOS Cameras for EBSD Micro-Structural Analysis
X-ray Fluorescence Analysis for Process Control

X-ray Fluorescence Analysis for Process Control
OIM Analysis for EBSD Mapping

OIM Analysis for EBSD Mapping
Analysing Energy Dispersive Spectroscopy Data Accurately and Efficiently with APEX™ Software

Analysing Energy Dispersive Spectroscopy Data Accurately and Efficiently with APEX™ Software
EDAX Launches New OIM Matrix Software Package for EBSD

EDAX Launches New OIM Matrix Software Package for EBSD
Join the EDAX Team at MCM 2017 in Rovinj, Croatia

Join the EDAX Team at MCM 2017 in Rovinj, Croatia
EDAX Introduces OIM™ Analysis 8.0

EDAX Introduces OIM™ Analysis 8.0
EDAX Introduces New Silicon Drift Detectors for Octane Elite Series

EDAX Introduces New Silicon Drift Detectors for Octane Elite Series
EDAX Pairs Element Silicon Drift Detector with New APEX Software Package for Tabletop Scanning Electron Microscopes

EDAX Pairs Element Silicon Drift Detector with New APEX Software Package for Tabletop Scanning Electron Microscopes
EDAX Launches the XLNCE X-Ray Metrology Series

EDAX Launches the XLNCE X-Ray Metrology Series
Pittcon 2015: EDAX Launches New XLNCE Series of XRF Analyzers for Coating Thickness and Composition Analysis

Pittcon 2015: EDAX Launches New XLNCE Series of XRF Analyzers for Coating Thickness and Composition Analysis
Pittcon 2015: EDAX Launches New XLNCE Series of XRF Analyzers For Coating Thickness and Composition Analysis

Pittcon 2015: EDAX Launches New XLNCE Series of XRF Analyzers For Coating Thickness and Composition Analysis
New Atom Probe Assist Tool from EDAX Improves Specimen Preparation Efficiency for Atom Probe Users

New Atom Probe Assist Tool from EDAX Improves Specimen Preparation Efficiency for Atom Probe Users
New Element Silicon Drift Detector from EDAX Delivers Power Performance in Compact Design

New Element Silicon Drift Detector from EDAX Delivers Power Performance in Compact Design
Orbis Micro-XRF Elemental Analyzer Setting New Standard in Analytical Flexibility

Orbis Micro-XRF Elemental Analyzer Setting New Standard in Analytical Flexibility
EDAX Launches Groundbreaking TEAM EDS System

EDAX Launches Groundbreaking TEAM EDS System
A (R)evolution of EBSD Pattern Detection

A (R)evolution of EBSD Pattern Detection
Advanced Spectrum Analysis and Quantification Precision/Accuracy

Advanced Spectrum Analysis and Quantification Precision/Accuracy
Beam Sensitive Samples and EDS Analysis

Beam Sensitive Samples and EDS Analysis
Correlating EDS and Micro-XRF

Correlating EDS and Micro-XRF
EDAX Instant Insight - Atom Probe Assist

EDAX Instant Insight - Atom Probe Assist
EDAX Instant Insight - NPAR™

EDAX Instant Insight - NPAR™
EDAX Instant Insight - PRIAS™

EDAX Instant Insight - PRIAS™
EDAX Instant Insight - XLNCE SMX XRF Analyzers

EDAX Instant Insight - XLNCE SMX XRF Analyzers
EDAX's User-Friendly Apex Software

EDAX's User-Friendly Apex Software
Frontiers in Integrated Microanalysis

Frontiers in Integrated Microanalysis
In A Hurry to Get Things Done? How to Get High Quality, High Speed Data Collection with EDS and EBSD - M&M 2016 Lunch & Learn

In A Hurry to Get Things Done? How to Get High Quality, High Speed Data Collection with EDS and EBSD - M&M 2016 Lunch & Learn
Integration of WDS into TEAM™

Integration of WDS into TEAM™
Latest Detector Technology from EDAX

Latest Detector Technology from EDAX
Low kV EDS - Mapping at Low Limits

Low kV EDS - Mapping at Low Limits
New Element Silicon Drift Detector from EDAX

New Element Silicon Drift Detector from EDAX
Next-Generation Hikari EBSD Camera from EDAX

Next-Generation Hikari EBSD Camera from EDAX
NPAR™ Demo Video

NPAR™ Demo Video
OIM Analysis™ v8 - What's New, What It Can Do, and How It Can Improve Your Materials Characterization - M&M 2016 Lunch & Learn

OIM Analysis™ v8 - What's New, What It Can Do, and How It Can Improve Your Materials Characterization - M&M 2016 Lunch & Learn
Optics - An Important Part of the WDS Spectrometer

Optics - An Important Part of the WDS Spectrometer
Pattern Region of Interest Analysis System (PRIAS™)

Pattern Region of Interest Analysis System (PRIAS™)
Practical Applications of EDS in Materials Science

Practical Applications of EDS in Materials Science
Recent Advances and Innovations in EBSD Microstructure Characterization

Recent Advances and Innovations in EBSD Microstructure Characterization
Smart Phase Mapping with TEAM ™ EDS Software Suite for SEM from EDAX

Smart Phase Mapping with TEAM ™ EDS Software Suite for SEM from EDAX
Spectrum Library Matching

Spectrum Library Matching
Synergistic Operation of WDS with EDS

Synergistic Operation of WDS with EDS
Tara Nylese - EDAX at M&M 2015

Tara Nylese - EDAX at M&M 2015
TEAM™ 3D Imaging and Quant (IQ) - Dr. Patrick Camus

TEAM™ 3D Imaging and Quant (IQ) - Dr. Patrick Camus
TEAM™ 3D Imaging and Quant (IQ) - Tara Nylese

TEAM™ 3D Imaging and Quant (IQ) - Tara Nylese
TEAM™ Analysis Systems

TEAM™ Analysis Systems
t-EBSD - Orientation Measurements in TEM Foils

t-EBSD - Orientation Measurements in TEM Foils
The Material Properties of Silicon Nitride Windows

The Material Properties of Silicon Nitride Windows
Transmission EBSD - Part 1

Transmission EBSD - Part 1
Transmission EBSD - Part 2

Transmission EBSD - Part 2
Understanding and Combining the Reindexing Functions in OIM Analysis™ v8

Understanding and Combining the Reindexing Functions in OIM Analysis™ v8
Visualizing True Structure of Materials with 3D EDS Solutions

Visualizing True Structure of Materials with 3D EDS Solutions

WDS - Where EDS Hits the Limit!

WDS - Where EDS Hits the Limit!
WDS Applications in Aircraft Technology

WDS Applications in Aircraft Technology
WDS in Glass Chemistry

WDS in Glass Chemistry
Welcome to EDAX!

Welcome to EDAX!
XLNCE SMX-BEN XRF Analyzer from EDAX

XLNCE SMX-BEN XRF Analyzer from EDAX
OIM Matrix™ Software Package

OIM Matrix™ Software Package
Velocity™ EBSD Camera Series

Velocity™ EBSD Camera Series
Spectrum Match Software Program

Spectrum Match Software Program
OIM Matrix™ Software Package

OIM Matrix™ Software Package
Clarity EBSD Detector Series

Clarity EBSD Detector Series
Lambda Wavelength Dispersive Spectrometry (WDS) Analysis System

Lambda Wavelength Dispersive Spectrometry (WDS) Analysis System
APEX™ Software for EDS

APEX™ Software for EDS
APEX Software for Electron Backscatter Diffraction (EBSD)

APEX Software for Electron Backscatter Diffraction (EBSD)
Velocity™ EBSD Camera Series

Velocity™ EBSD Camera Series
OIM Analysis Software

OIM Analysis Software
Neighbor Pattern Averaging & Reindexing (NPAR™)

Neighbor Pattern Averaging & Reindexing (NPAR™)
Octane Elite EDS System

Octane Elite EDS System
Pattern Region of Interest Analysis System (PRIAS)

Pattern Region of Interest Analysis System (PRIAS)
Atom Probe Assist for Grain Boundary Segregation Analysis

Atom Probe Assist for Grain Boundary Segregation Analysis
Neptune Analysis System - Integrated EDS and WDS from EDAX

Neptune Analysis System - Integrated EDS and WDS from EDAX
Octane Elect EDS System: Enhanced Energy Dispersive Spectroscopy Platform

Octane Elect EDS System: Enhanced Energy Dispersive Spectroscopy Platform
Element EDS System: Powerful Analytical Capability in a Compact Package

Element EDS System: Powerful Analytical Capability in a Compact Package
Pegasus (EDS-EBSD) System

Pegasus (EDS-EBSD) System
Materials Characterization with Trident from EDAX

Materials Characterization with Trident from EDAX
Neighbor Pattern Averaging and Reindexing (NPAR™)

Neighbor Pattern Averaging and Reindexing (NPAR™)
OIM™ Analysis

OIM™ Analysis
Pattern Region of Interest Analysis System (PRIAS™) from EDAX

Pattern Region of Interest Analysis System (PRIAS™) from EDAX
Spectrum Match

Spectrum Match
EBSD for the EDS User: Understanding the Hows and Whys of Electron Backscatter Diffraction

EBSD for the EDS User: Understanding the Hows and Whys of Electron Backscatter Diffraction
How To Analyze Multiphase samples with CompoMaps and Spectrum Libraries

How To Analyze Multiphase samples with CompoMaps and Spectrum Libraries
How to Use Saved EBSD Patterns in Specific Applications

How to Use Saved EBSD Patterns in Specific Applications
When and How to Use ChI-Scan™ in OIM Analysis™ v8

When and How to Use ChI-Scan™ in OIM Analysis™ v8
How to Apply Microanalysis to the Life Sciences

How to Apply Microanalysis to the Life Sciences
Correlative Microscopy with OIM Analysis™

Correlative Microscopy with OIM Analysis™
How to Use NPAR™ in OIM Analysis™ v8

How to Use NPAR™ in OIM Analysis™ v8
Practical Quantitative Analysis - How to Optimize the Accuracy of your Data

Practical Quantitative Analysis - How to Optimize the Accuracy of your Data
Learn How I Prepare Samples for EBSD Analysis

Learn How I Prepare Samples for EBSD Analysis
EBSD OIM Analysis™ with NPAR™ or How to Salvage Your Datasets!

EBSD OIM Analysis™ with NPAR™ or How to Salvage Your Datasets!
Advances in EDS Throughput - From X-ray Counts to Solutions

Advances in EDS Throughput - From X-ray Counts to Solutions
Elemental Microstructural Analysis - Combining structure and chemistry from cm to atoms: EBSD combined with EDS and APT

Elemental Microstructural Analysis - Combining structure and chemistry from cm to atoms: EBSD combined with EDS and APT
Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis

Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis
EDS in the TEM: Fundamentals and Principles

EDS in the TEM: Fundamentals and Principles
Measuring Al Coatings with X-Ray Fluorescence [XRF]

Measuring Al Coatings with X-Ray Fluorescence [XRF]
Texture Analysis via EBSD

Texture Analysis via EBSD
How to Optimize Backgrounds for EBSD Analysis on Multiphase Samples Using OIM Analysis™ v8?

How to Optimize Backgrounds for EBSD Analysis on Multiphase Samples Using OIM Analysis™ v8?
Can Direct Electron Detection be Used to Improve EBSD Analysis?

Can Direct Electron Detection be Used to Improve EBSD Analysis?
How to Get the Most Out of Orbis Micro-XRF Measurements with Multiple Acquisition Conditions?

How to Get the Most Out of Orbis Micro-XRF Measurements with Multiple Acquisition Conditions?
EDS Mapping: Data Collection, Representation, Extraction, and Mining

EDS Mapping: Data Collection, Representation, Extraction, and Mining
EBSD for the EDS User: Understanding the Hows and Whys of Electron Backscatter Diffraction

EBSD for the EDS User: Understanding the Hows and Whys of Electron Backscatter Diffraction
How to Analyze Multiphase Samples with CompoMaps and Spectrum Libraries?

How to Analyze Multiphase Samples with CompoMaps and Spectrum Libraries?

Sponsored Content

Editorial Highlights

The Current State of the Global Semiconductor Market

The Current State of the Global Semiconductor Market

The global semiconductor market has entered an exciting period. Demand for chip technology is both driving the industry as well as hindering it, with current chip shortages predicted to last for some time. Current trends will likely shape the future of the industry, which is set to continue to show

How are Graphene Batteries Made?

How are Graphene Batteries Made?

The primary distinction between graphene-based batteries and solid-state batteries lies in the composition of either electrode. Although the cathode is commonly changed, carbon allotropes can also be employed in fabricating anodes.