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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems, their tools are used for R&D across a wide range of academic and industrial applications including:
Oxford Instruments NanoAnalysis technologies include:
Introducing A New Imaging Technique BEX - Backscattered Electron and X-ray
Using EBSD to Reconstruct Illegible Serial Numbers on Crystalline Materials
Combining Electron BackScatter Diffraction with EDS to Differentiate Compounds with Similar Crystal Structures
Using Low kV EDS to Analyze a NAND Flash Memory Device
Analyzing Highly Insulating Ceramics
Li-Ion Battery Production Application Highlight - Identifying Contamination
Determining Particle Size with a Table Top Microscope
Preparing a TEM Lamella for Fast Backside Thinning Using the OmniProbe 400
SEM to Study Li-Ion Battery Materials
Validating the Technical Cleanliness of Ball Bearings
Characterizing Complex Rock Samples with EBSD
Rapid Characterization of Deformed Quartz Rocks
Symmetry® - High Angular Resolution at High Speeds
Comprehensive EBSD Study of a Bivalve Shell
Fast and Effective EBSD Mapping of Martensitic Stainless Steel
Characterizing Microstructures in Steel and Ni at High Speeds
Generating Orientation Maps to Present EBSD Data
Acquiring Data Using EBSD
Developments in EBSD
An Introduction to EBSD
Particle Analysis in Geology, Pollution, and Wear Analysis with Energy Dispersive Spectroscopy
Large Area EDS Mapping - Phase Distribution in Archaeological Samples
Microstructure Analysis of a Bent Aluminium Alloy Using In-Situ EBSD
Characterizing Aluminium Alloy and its Inter-Metallic Phases Using EDS (Energy-Dispersive X-Ray Spectroscopy)
EBSD Characterization of Industrial Materials after Ion Milling
Mineral Liberation Analysis in Conventional SEM with INCAMineral
Phase Characterization of Igneous Rock Using AutoPhaseMap Module of AZtecEnergy
EBSD Characterization of Hydrides in Zirconium Alloys for Nuclear Applications
How AZtecWave Enables Accurate Results
AZtec Live Chemical Imaging
EDS Detector for Routine SEM Analysis
Oxford Instruments Launches Unity – the World’s First Commercial Detector for Instant Chemical Imaging
AZtecFeature Particle Analysis System
Ultim Extreme for Ultra-High-Resolution SEM
C-Swift CMOS Detector for Materials Analysis and High-Throughput Sample Characterization
AZtecLive and Ultim Max: Combining Technologies to Revolutionize EDS Analysis
A technology breakthrough: why CMOS-based detectors are changing the way we use EBSD
AZtecLive: A revolutionary approach to SEM-EDS Analysis
AZtecCrystal MapSweeper – harnessing the power of EBSD pattern matching technology for the semiconductor industry
High temperature EDS analysis - enabling in situ heating for direct observation of phase transformations in the SEM