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With more than 60 years of innovation and leadership, FEI enables customers to find meaningful answers to questions that accelerate breakthrough discoveries, increase productivity, and ultimately change the world. FEI designs, manufactures, and supports the broadest range of high-performance microscopy workflows that provide images and answers in the micro-, nano-, and picometer scales.
Combining hardware and software expertise in electron, ion, and correlative microscopy with deep application knowledge in the materials science, life sciences, electronics, and natural resources markets, the worldwide FEI team of 2,700+ employees is dedicated to customers’ pursuit of discovery and resolution to global challenges.
The Focused Ion Beam Revolution: How FIB Instruments Transformed Sample Preparation
Enabling Li-ion Batteries with Cryo-FIB and Atom Probe Tomography
The Advantages of Automation: Improving Accessibility, Delivering Productivity, and Ensuring Confidence
Using Failure Analysis to Determine Corroded Steel Surfaces
Determining Contaminants Within Battery Materials
How to Characterize Tire Fillers
How to Measure Failure Analysis on Automotive Parts
Quantitative Elemental Mapping of Minerals
SEM-EDS analysis for Geochronological Studies
How to Characterize Complex Refractories in Steel Production
Measuring High-Strength Steel with Bend Failure Analysis
Analysis of Metal Components Using XPS
Using XPS to Map the Work Function of a Damaged Solar Cell
Using Argon Cluster Ions to Prevent Surface Modification
Using an XPS System to Investigate Printed Paper
Characterization of 2D Materials with Multi-Technique Surface Analysis
Why are These 3 Elements in the Surface Analysis Spotlight?
Gaining Insights into the Analysis of 2D Materials Using the Thermo Scientific Nexsa Surface Analysis System
Using a Surface Analysis System to Determine Layer Structures of an Organic FET Device
Plasma-Modified Polymer Surfaces - How to Identify their Structures
Using XPS, REELS, and UPS for the Surface Characterization of Organic LED Material
Analyzing Electrode Materials for Lithium Ion Batteries
Coverage, Composition and Band Gap Analysis of ALD-Grown Ultra Thin Films
XPS Image Acquisition in Minutes Using SnapMap
Advantages of Coincident XPS-Raman in the Analysis of Mineral Oxides Species
Understanding Graphene and its Properties Through X-Ray Photoelectron Spectroscopy
Hydrogen and Chemical Quantification of an Organic Coating
Characterizing SEIs on Tin-Based Nano-Composite Electrode Films for Li-ion Batteries
Investigating Surface Treatment of Fabrics with XPS
Chemical State Mapping of Polymers with XPS
Identifying the Elemental and Chemical Composition of Stained Areas on Split Steel Bearings
Investigating Changes in Elemental Composition of a Hard Disk Platter from the Surface Down to the Substrate
Analyzing the Interface Between a Dry Film Photo-Resist Layer and its Protective Polypropylene Layer with XPS
Using X-Ray Photoelectron Spectroscopy to Characterize Low-Emissivity Glass Coatings
Liquid Phase Photoelectron Spectroscopy Analysis of Chemical Bonding States in an Ionic Liquid
Using XPS to Evaluate the Elemental and Chemical Composition of Wear Resistant Coatings
Analyzing the Elemental and Chemical Composition of Contact Lens Samples
Using XPS for the Spectroscopic Analysis of Solid Oxide Fuel Cell Material
Using the K-Alpha for the XPS Characterization of Thin Gold Layers on Steel Separators for Fuel Cell Applications
Characterizing a Membrane Electrode Assembly from a Proton Exchange Fuel Cell Using XPS
Using XPS for the Characterization of ‘Click’ Surface Chemistry
Investigating the Surface Chemical Composition of Metal Oxide Catalysts
Using X-Ray Photoelectron Spectroscopy (XPS) to Investigate the Oxidation of a Cobalt-Based Catalyst
Depth Profile Analysis of Thin Film Solar Cells by XPS
Advanced SEM Sample Preparation for Traditional and Air-sensitive Materials
Creating a Core Center for Electron Microscopy Science and Techniques
Advancements in Electron Microscopy: Where Modern Nano-Scale Imaging Meets Next-Level Analysis
Exploring the Capabilities of Electron Microscopy and Microanalysis
Using Focused Ion Beam Without Gallium For “Damage-Free” TEM Specimen Preparation
How Automation Saves Time through the Power of Scripting with a Desktop SEM
Achieve Higher Performance with your Microscope with Minimal Effort Using Automated Alignments
How can you Advance your Research Efficiently with the New ESCALAB QXi Microprobe?
Next Generation Analysis on Lithium Samples
Leveling Up Surface Analysis and XPS Performance with Nexsa G2 System
Automated Particle Workflow: Revolutionizing Nanoparticle Analysis and Product Optimization
Insights into microCT Technology: Evolvement, Applications and Automation
Characterization of Catalyst Nanoparticles
Can Surfaces Help in the Fight Against COVID-19 and Other Viruses?
1+1=3: How a Combination of XPS and Raman Makes a Difference for Your Materials Analysis
Studying 2D Materials Using Thermo Scientific Nexsa X-Ray Photoelectron Spectrometer (XPS) System
Nexsa - Unparalleled Sensitivity for Large and Small Area Analysis
Materials Analysis with Nanoscale Precision Using EDS
New Thermo Scientific Prisma SEM Combines Performance and Versatility
Thermo Scientific Krios G3i Cryo-Electron Microscope Wins Gold Edison Award
Cool Microscope Technology Revolutionises Biochemistry
New Multi-Scale Imaging System Provides Insight into a Material’s Internal 3D Structure
The FIB Revolution - Discussing the History and Future of TEM Sample Preparation
Helios 5 Laser PFIB System
Spectra Ultra S/TEM
Phenom ParticleX Steel Desktop SEM
Axia ChemiSEM
Focused Ion Beam Scanning Electron Microscope — Helios Hydra DualBeam
Desktop SEM with FEG Source for High Brightness Imaging — Phenom Pharos Desktop SEM
Desktop SEM with High Brightness and Color Navigation Camera — Phenom Pro Desktop SEM
Desktop SEM for High-Performance Imaging and EDS Analysis — Phenom ProX Desktop SEM
Economical Desktop SEM with Reliable Ease-of-Use Features and Automation — Phenom Pure Desktop SEM
Thermo Scientific Apreo 2 SEM for Materials Science
Thermo Scientific™ Nexsa™ G2 Surface Analysis System
Thermo Scientific™ K-Alpha™ XPS System
Introducing ChemiSEM - The Complete Tool for Understanding Failure Analysis
Next Frontier - CryoEM for Quantum Materials and Energy Research
TEM Made Easy: Live Webinar & Demo on Talos S/TEM for Materials Science
Discover How to Perform Advanced SEM Sample Preparation for Air-sensitive Materials